Abstract: 81110A wafer prober P12xl UF3000 c3600 C3750 E4980A E4980 ic 4075 or gate Text: Subsystem 5 Capacitance Measurement Options Agilent E4980A LCR Meter Built-In HSCMU 7 Pulse , feature size are driving the need for new parametric test capabilities in IC production The LCR Meter Task has added Agilent E4980A current configuration and measured parameters to the User Variable list. Moderate updates to the Main Vision Manual. Version 5.27.6 - 19 August 2020
Dec 16, 2020 · The tDOS of solar cells were derived from the frequency-dependent capacitance (C-f) and voltage-dependent capacitance (C-V), which were obtained from the thermal admittance spectroscopy (TAS) measurement performed by an LCR meter (Agilent E4980A). The transient photovoltage was measured under 1 sun illumination.